Measuring M2 values for On-Wafer Vertical Cavity Surface Emitting Lasers

North, William K.; Chacko, David; Zeidler, Peter R.; Blane, Janice T.; Ingold, Kirk A.; Souhan, Brian; Raftery, James J.

Measuring M2 values for On-Wafer Vertical Cavity Surface Emitting Lasers

Date

2015

Authors

Publisher

OSA

Abstract

We report on M2 measurements taken for on-wafer vertical cavity surface emitting lasers (VCSELs). We measured M2 for oxide-confined VCSELs and photonic crystal (PhC) VCSELs of similar lasing aperture sizes.

Keywords

Apertures, Gaussian beams, Lenses, Optical confinement, Photonic crystals, Vertical Cavity Surface Emitting Lasers

Citation

W. North, D. Chacko, P. Zeidler, J. Blane, K. Ingold, B. Souhan, and J. J. Raftery, "Measuring M2 values for On-Wafer Vertical Cavity Surface Emitting Lasers," in Frontiers in Optics 2015, OSA Technical Digest (online) (Optica Publishing Group, 2015), paper JW2A.30.