Measuring M2 values for On-Wafer Vertical Cavity Surface Emitting Lasers
Loading...
Issue Date
Type
proceedings-article
Language
Alternative Title
Abstract
We report on M2 measurements taken for on-wafer vertical cavity surface emitting lasers (VCSELs). We measured M2 for oxide-confined VCSELs and photonic crystal (PhC) VCSELs of similar lasing aperture sizes.
Description
Citation
W. North, D. Chacko, P. Zeidler, J. Blane, K. Ingold, B. Souhan, and J. J. Raftery, "Measuring M2 values for On-Wafer Vertical Cavity Surface Emitting Lasers," in Frontiers in Optics 2015, OSA Technical Digest (online) (Optica Publishing Group, 2015), paper JW2A.30.
Publisher
OSA