Measuring M2 values for On-Wafer Vertical Cavity Surface Emitting Lasers
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Authors
North, William K.
Chacko, David
Zeidler, Peter R.
Blane, Janice T.
Ingold, Kirk A.
Souhan, Brian
Raftery, James J.
Issue Date
2015
Type
proceedings-article
Language
Keywords
Apertures , Gaussian beams , Lenses , Optical confinement , Photonic crystals , Vertical Cavity Surface Emitting Lasers
Alternative Title
Abstract
We report on M2 measurements taken for on-wafer vertical cavity surface emitting lasers (VCSELs). We measured M2 for oxide-confined VCSELs and photonic crystal (PhC) VCSELs of similar lasing aperture sizes.
Description
Citation
W. North, D. Chacko, P. Zeidler, J. Blane, K. Ingold, B. Souhan, and J. J. Raftery, "Measuring M2 values for On-Wafer Vertical Cavity Surface Emitting Lasers," in Frontiers in Optics 2015, OSA Technical Digest (online) (Optica Publishing Group, 2015), paper JW2A.30.
Publisher
OSA