Focused ion beam post-processing for single mode photonic crystal vertical cavity surface-emitting lasers

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Authors

Danner, Aaron J.
Yokouchi, Noriyuki
Raftery, James J.
Choquette, Kent D.

Issue Date

2003

Type

proceedings-article

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Keywords

Crystalline materials , Etching , Ion beams , Laser modes , Lattices , Optical materials , Photonic crystals , Silicon compounds , Surface emitting lasers , Vertical Cavity Surface Emitting Lasers

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Abstract

In this paper, we present the first photonic crystal VCSELs fabricated using FIBE method whereby photonic crystal holes can be etched into prefabricated VCSELs.

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Citation

Danner, Aaron J., N. Yokouchi, James J. Raftery and Kent D. Choquette. “Focused ion beam post-processing for single mode photonic crystal vertical cavity surface-emitting lasers.” 61st Device Research Conference. Conference Digest (Cat. No.03TH8663) (2003): 155-156.

Publisher

IEEE

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EISSN