Loss and the accuracy of the photonic crystal model in holey VCSELs
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Authors
Danner, Aaron J.
Raftery, James J.
Leisher, Paul O.
Yamaoka, E.A.
Lala, S.R.
Hwang, M.L.
Choquette, Kent D.
Issue Date
2005
Type
proceedings-article
Language
Keywords
Optical losses , Photonic crystals , Vertical Cavity Surface Emitting Lasers , Apertures , Etching , Predictive models , Distributed Bragg reflectors , Optical devices , Optical interconnections , Optical refraction
Alternative Title
Abstract
A comprehensive parametric study of VCSELs incorporating etched holes for lateral confinement was conducted. Results from over two thousand devices reveal the role of loss and verify the predictive abilities of the photonic crystal model.
Description
Citation
A. J. Danner et al., "Loss and the accuracy of the photonic crystal model in holey VCSELs," (CLEO). Conference on Lasers and Electro-Optics, 2005., Baltimore, MD, USA, 2005, pp. 1927-1928 Vol. 3, doi: 10.1109/CLEO.2005.202322.
Publisher
IEEE